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The Dark Side of Silicon

Amir M. Rahmani, Pasi Liljeberg, Ahmed Hemani, Axel Jantsch, Hannu Tenhunen (Eds.), The Dark Side of Silicon, Springer, 2016.

http://dx.doi.org/10.1007/978-3-319-31596-6

Abstract:

This book presents the state-of-the art of one of the main concerns with microprocessors today, a phenomenon known as "dark silicon". Readers will learn how power constraints (both leakage and dynamic power) limit the extent to which large portions of a chip can be powered up at a given time, i.e. how much actual performance and functionality the microprocessor can provide. The authors describe their research toward the future of microprocessor development in the dark silicon era, covering a variety of important aspects of dark silicon-aware architectures including design, management, reliability, and test. Readers will benefit from specific recommendations for mitigating the dark silicon phenomenon, including energy-efficient, dedicated solutions and technologies to maximize the utilization and reliability of microprocessors.

BibTeX entry:

@BOOK{eRaLiHeJaTe16a,
  title = {The Dark Side of Silicon},
  editor = {Rahmani, Amir M. and Liljeberg, Pasi and Hemani, Ahmed and Jantsch, Axel and Tenhunen, Hannu},
  publisher = {Springer},
  year = {2016},
  ISBN = {978-3-319-31594-2},
  ISSN = {978-3-211 ; 978-3-7091 ; 978-3},
}

Belongs to TUCS Research Unit(s): Embedded Computer and Electronic Systems (ECES)

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