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New Ideas for Accelerated Testing and Analysis
Jarno Kankaanranta, Ossi Hämeenoja, Aulis Tuominen, New Ideas for Accelerated Testing and Analysis. In: ICEP 2008, International Conference on Electronics Packaging, Tokyo Japan, 2008.
BibTeX entry:
@INPROCEEDINGS{inpKaHaTu08a,
title = {New Ideas for Accelerated Testing and Analysis},
booktitle = {ICEP 2008, International Conference on Electronics Packaging, Tokyo Japan},
author = {Kankaanranta, Jarno and Hämeenoja, Ossi and Tuominen, Aulis},
year = {2008},
}
Belongs to TUCS Research Unit(s): TUCS Productization Laboratory