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Scenario-based Test Case Generation Using Event-B Models

Qaisar A. Malik, Johan Lilius, Linas Laibinis, Scenario-based Test Case Generation Using Event-B Models. In: In proceedings of International IEEE Conference on Advances in System Testing and Validation Lifecycle (VALID 2009), IEEE Computer Society, 2009.

Abstract:

In this paper, we present an extension of the previously reported model-based testing approach that is based on formal models and user-provided testing scenarios. In this approach, the user provides a testing scenario on the level of an abstract model. When the abstract model is refined to add or modify features, the corresponding testing scenarios are automatically refined to incorporate these changes. The testing scenarios are unfolded into test cases containing the required inputs and expected outputs. To automate this test-case generation process, we provide guidelines for the formal development of system models. We use Event-B as our formal framework. We also propose a method for automatic generation of Java implementation templates for Event-B specifications. The corresponding testing scenarios are translated into JUnit test cases.

BibTeX entry:

@INPROCEEDINGS{inpMaLiLa09a,
  title = {Scenario-based Test Case Generation Using Event-B Models},
  booktitle = {In proceedings of International IEEE Conference on Advances in System Testing and Validation Lifecycle (VALID 2009)},
  author = {Malik, Qaisar A. and Lilius, Johan and Laibinis, Linas},
  publisher = {IEEE Computer Society},
  year = {2009},
  keywords = {Model-based testing, JUnit, test generation, Event-B },
}

Belongs to TUCS Research Unit(s): Distributed Systems Laboratory (DS Lab), Embedded Systems Laboratory (ESLAB)

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