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Temperature Behavior of Combination Selection Based Mismatch Calibration with 65 nm CMOS Technology

Joona Marku, Jonne Poikonen, Ari Paasio, Temperature Behavior of Combination Selection Based Mismatch Calibration with 65 nm CMOS Technology. In: Proc. of the IEEE International System on Chip Conference, 2009. SOCC 2009. , 2009.

BibTeX entry:

@INPROCEEDINGS{inpMaPoPa09b,
  title = {Temperature Behavior of Combination Selection Based Mismatch Calibration with 65 nm CMOS Technology},
  booktitle = {Proc. of the IEEE International System on Chip Conference, 2009. SOCC 2009. },
  author = {Marku, Joona and Poikonen, Jonne and Paasio, Ari},
  year = {2009},
}

Belongs to TUCS Research Unit(s): Microelectronics

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